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Beilstein J. Nanotechnol. 2022, 13, 817–827, doi:10.3762/bjnano.13.72
Figure 1: (a) Typical force–distance Fn(Z) curve recorded with a SiOx tip on the eutectic Ga–In–Sn melt at ro...
Figure 2: Contact AFM topography images recorded on the surface of eutectic Ga–In–Sn with (a) SiOx, (b) PtSi,...
Figure 3: Typical (a–c) Fn- and (d–f) Fl-traces recorded in contact AFM mode on the surface of the eutectic G...
Figure 4: Fad(T) plots for different pulling velocity values dZ/dt = 0.25–25 mm/s for (a) a SiOx tip, (b) a P...
Figure 5: (a, d, g) Interfacial energy γ as a function of the temperature determined with dZ/dt = 0.25–25 mm/...
Figure 6: XPS results for the eutectic Ga–In–Sn melt (a) before and (b) after heating at 100 °C for 3 h.
Figure 7: SEM images of the AFM tips used to collect the results presented in Figure 2: (a, d) SiOx tip, (b, e) Au ti...
Beilstein J. Nanotechnol. 2015, 6, 1721–1732, doi:10.3762/bjnano.6.176
Figure 1: (a) Non-contact (nc)-AFM image of an AFM-indentation on Pt(111) (z-scale: 7 nm) and highlighted mas...
Figure 2: Series of rate-dependent AFM indentation curves (a) before and (b) after drift correction; the drif...
Figure 3: (a) SEM image of the diamond coated AFM tip used for all measurements presented in this report; tip...
Figure 4: nc-AFM images of indented surfaces as a function of (left) the maximal loads Pmax and of (right) th...
Figure 5: (a,b) Pile-up volume Vpile up, (c,d) projected area Ap as a function of Pmax for (a,c) Pt(111) and ...
Figure 6: (a,b) Pile-up volume Vpile up, (c,d) projected area Ap as a function of dP/dt for (a,c) Pt(111) and...
Figure 7: P–δ curves as a function of (a,b) the maximal load Pmax and (c,d) the loading-rate on (a,c) Pt(111)...
Figure 8: Projected area Ap as determined from nc-AFM images as a function of the maximal indentation depth δ...